粉体行业在线展览

产品

产品>

分析仪器设备>

光学仪器及设备

>太阳光谱反射率及发射率测量仪

太阳光谱反射率及发射率测量仪

直接联系

光傲科技股份有限公司

美国

产品规格型号
参考报价:

面议

关注度:

1419

产品介绍

TESA2000是在TEMP 2000A基础上增加光谱半球反射率测定功能,光谱范围250 nm to 2500 nm ,主要用于材料太阳光谱吸收、反射特性测试。

AZ Technology's TESA 2000 Portable Emissometer/Reflectometer and Solar Reflectometer, is compact, lightweight, rugged, and ergonomically engineered for ease of use in the field or in the laboratory to determine ambient temperature total emittance and solar reflectance of test surfaces.

The TESA 2000 can be conveniently used in a laboratory setting (top right image) where samples can be sat atop the instrument and left while repeated measurements are being taken, or as a portable unit (bottom right image).

The TESA 2000 provides in a single unit:

1) A portable emissometer/reflectometer that performs optically integrated total hemispheric reflectance measurements from less than 3 to greater than 35 micrometers wavelength. Thus, performing the same measurement as the TEMP 2000A (the recognized replacement for the no longer produced Gier Dunkle DB-100 IR Reflectometer**), providing improved emittance determination performance and maintainability, and in accordance with the ASTM E408 standard.

2) A portable solar reflectometer that performs optically integrated total hemispheric reflectance measurements.

The TESA 2000 optical system has been designed to minimize losses, to facilitate and maintain optical alignment, and to utilize the features of AZ Technology's patented ellipsoid collector (Patent Number 5,659,397) that allows compactness for portability, efficiency, and measurement accuracy. The instrument is fully portable and can be used in the most remote locations. The instrument is available with carrying cases (which will fit in the overhead bin of most jet aircraft), rechargeable batteries, battery charger, instrument inspection head, display unit, and an operator vest.

The table below lists specifications for the TESA 2000.

Emittance wavelength <3um to>35um (not limited by filters, windows, etc.) Reflectance wavelength 250 to 2500 nm Measurement accuracy (for specular and diffuse samples) - ± 1% of full scale for gray samples - ± 3% of full scale for non-gray samples Repeatability- ± 0.5% of full scale or better Sample type Any Sample, including foils, insulators, etc. Sample size and geometry-Flat Surfaces: ≥ 0.4 inches (1 cm) diameter Sample temperature Room Temperature, Ambient Readouts -Digital LCD panel meter -Selectable solar reflectance solar absorption and IR reflectance/emittance display Measurement range (reflectance) 0.05 to 1.00 Dimensions-Optical Head: 5" diameter x 8" long -Control and Display Unit: 7.5 x 5.5 x 3 inches -Battery Box: 7.5 x 6.25 x 4.0 inches -Carry Case: 12.5 x 17 x 11 inches Weight-Optical Head: 6 pounds -Control and Display Unit: 3.25 pounds -Battery Box: 11 pounds -Carry Case: 9 pounds Warranty 1 year parts and labor

*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably. **The TESA 2000 represents an excellent option for replacing a Gier Dunkle DB100 while adding more capabilities and increased portability

产品咨询

太阳光谱反射率及发射率测量仪

光傲科技股份有限公司

请填写您的姓名:*

请填写您的电话:*

请填写您的邮箱:*

请填写您的单位/公司名称:*

请提出您的问题:*

您需要的服务:

发送

中国粉体网保护您的隐私权:请参阅 我们的保密政策 来了解您数据的处理以及您这方面享有的权利。 您继续访问我们的网站,表明您接受 我们的使用条款

太阳光谱反射率及发射率测量仪 - 1419
光傲科技股份有限公司 的其他产品

FLOW

光学仪器及设备
相关搜索
关于我们
联系我们
成为参展商

© 2026 版权所有 - 京ICP证050428号